Aggregator
Operator SIGN IN
IDA2C04 Faulting
Operator SIGN IN
Scan of harp_tagger
Scan of harp_2c21
APPROVED B04 Replace (2) photocells
Follow-up Re: Some insulation damage on MO near 1L09
APPROVED B01 Replace photocell at door 6
CREW CHIEF SIGN IN
THOMAS JEFFERSON NATIONAL ACCELERATOR FACILITY
ACCELERATOR OPERATIONS CREW CHIEF SIGN IN FORM
Date : 05-06-26
Time : 07:31:04
Day : Wednesday
Shift : Day
Crew Chief : Schoene
Program Deputy: Sereno
Team : B
Arm : Thomas
Designated SSO: Barker
LERF Operator:
Operators : Barker, Thomas
This stamp certifies that the above Crew Chief has read/reviewed/received the following:
Crew Chief Shift Log, 2026-05-06 OWL
Start of shift: CW to xCD. Tune to xB Tagger.
QuickPic - xD -> JD70-107 55um 45/135 at 25nA
iCalibrate: Hall D
Crew Chief Timesheet Summary: 06 May 2026 OWL
Main machine optics with and without Buncher change
The buncher gradient going from 4 to 4.4 with Inj SME approval seems to have not affected main machine optics.
fig 1 is AE harp with Buncher at new setpoint
fig 2 is Buncher at nominal
Figs 3 and 4 are the sme order at 5C00
However, the optics are very different from Monday? very puzzling. See fig 5 for 5C00 comparison to monday
Follow-up Re: High NA Rack Room Temps - Propped Open Rack Room Door
Downtime Incident CLOSED: Wednesday Owl Harp Swipes
FSD Masking Tool: Successful System UN-Masking for: BeamLossMonitor
User: samari
Areas: All
BeamLossMonitor Devices:
ILM0I07
ILM0L01A
ILM0L01B
ILM0L02
ILM2D00A
ILM2D00B
ILM0L04A
ILM0L04B
ILM0L05
ILM0L06A
ILM0L08
ILM0R01
ILM4D00
ILM0R03
ILM0R04
ILM0R06
ILM0R08
ILM0R09
ILM1L01
ILM1L02
ILM6R08
ILM3S00
ILM7S00
ILM9S00
ILM5S10
ILM5E03
ILM7S01
ILM9A01
ILM3E02
ILM5A01
ILM1A04
ILM1A06
ILM1A09
ILM5A10
ILM1A16
ILM1A19
ILM3R10
ILM9R07
ILM1R09
ILM2L03
ILM5R10
ILM5R05
ILM2L01
ILM2T09
ILM8
Impact of SHG Doubling Efficiency on DC Light and Beam Bleed-Through
The laser doubling efficiencies are currently too low (see linked entries). The bleed-through issues observed in the halls are likely tied to the performance of the laser system. In particular, the level of DC light present between the CW pulses is directly related to the second-harmonic generator (SHG) doubling efficiency.
Improving SHG performance is therefore essential: increasing the conversion efficiency will reduce the residual DC light between pulses and, in turn, mitigate the resulting electron beam bleed-through.










